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Title:
COMPLEX ENVIRONMENTAL TEST METHOD, FAILURE DETECTION METHOD, FAILURE DETECTION PROGRAM, AND RECORDING MEDIUM FOR RECORDING FAILURE DETECTION PROGRAM
Document Type and Number:
Japanese Patent JP2009300142
Kind Code:
A
Abstract:

To provide a complex environmental test method having high reproducibility, and to provide a failure detection method, a failure detection program, and a recording medium for recording the failure detection program capable of performing a complex environmental test having high reproducibility, and evaluating reliability highly accurately by simple measurement.

The complex environmental test method for evaluating reliability to cracks on a soldering part of an electronic component mounting substrate includes step S1 for performing a temperature cycle test to the electronic component mounting substrate until an initial crack is generated on the soldering part, and step S2 for performing a vibration test to the electronic component mounting substrate subjected to the temperature cycle test.


Inventors:
Aoki, Yuichi
Application Number:
JP2008000152527
Publication Date:
December 24, 2009
Filing Date:
June 11, 2008
Export Citation:
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Assignee:
ESPEC CORP
International Classes:
G01M7/02; G01N3/60; G01M7/00; G01N3/60