Title:
COMPLEX MICROSCOPE
Document Type and Number:
Japanese Patent JP3706450
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To achieve complex measurability by using a current type optical scanning chemical microscope or potential type optical scanning chemical microscope in combination with a laser microscope or X-ray microscope.
SOLUTION: A sensor part 4 consisting of a photo-conductive layer exhibiting electric conductiveness only in its part irradiated with light directly is formed on one surface of a light transmissive base board 1. A counter-electrode 8 and reference electrode 9 are contacted with a sample 7 which is installed in such a way as contacting with the sensor part 4. A voltage is impressed between the counter-electrode 8 and base board 1, and the other surface of the base board 1 is irradiated as optical scanning, and the current change caused by voltage impression is taken out from the base board 1. This current type optical scanning chemical microscope A is used in combination with a laser microscope or X-ray microscope B. An ion sensitive pigment is set as permeating the sample 7 for measurement so that cells 7a in it 7 are colored, and this is placed on the sensor part 4. The ion concentration distribution outside the cells 7a are measured by the microscope A, while the concentration distribution inside the cells 7a are measured by the microscope B, and the results are displayed on a computer 19.
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Inventors:
Katsuhiko Tomita
Application Number:
JP33492996A
Publication Date:
October 12, 2005
Filing Date:
November 28, 1996
Export Citation:
Assignee:
HORIBA, Ltd.
International Classes:
G01N23/00; G01N21/00; G01N27/416; G02B21/00; G21K7/00; (IPC1-7): G01N27/416; G02B21/00; G21K7/00
Domestic Patent References:
| JP1097853A | ||||
| JP8213580A | ||||
| JP792120A | ||||
| JP8086771A | ||||
| JP9210958A |
Attorney, Agent or Firm:
Hideo Fujimoto