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Title:
COMPOSITION, PATTERN FORMATION METHOD AND SEMICONDUCTOR DEVICE
Document Type and Number:
Japanese Patent JP2023045109
Kind Code:
A
Abstract:
To provide a composition which can be brought into close contact with a surface including both a conductive material and an insulation material, a semiconductor device having a first layer obtained from the composition, and a pattern formation method using the composition.SOLUTION: A composition contains a compound. The compound includes a connection group which has 2 to 18 carbon atoms and includes a carbon atom, a polymerizable functional group which is coupled to the connection group and can form a covalent bond with a photocurable resin by radical reaction, a first reactive group which is coupled to the connection group and can form a covalent bond with a metal atom, and a second reactive group which is coupled to the connection group and can form a covalent bond with a compound containing Si and O by hydrolysis or dehydration reaction.SELECTED DRAWING: Figure 1

Inventors:
HIGUCHI TSUYOSHI
IWASAKI TAKAHIRO
Application Number:
JP2021153336A
Publication Date:
April 03, 2023
Filing Date:
September 21, 2021
Export Citation:
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Assignee:
KIOXIA CORP
International Classes:
C08F16/36; C08F2/48; H01L21/312
Attorney, Agent or Firm:
Patent Attorney Corporation Suzue Patent General Office