Title:
コンピュータトモグラフィ
Document Type and Number:
Japanese Patent JP6839645
Kind Code:
B2
Abstract:
Apparatus for computed tomography is described that is also suitable for X-ray diffraction. The computed tomography measurement uses a line focus 8 and passes the X-rays from the line focus through a perpendicular slit 22 and then through a sample onto a two dimensional detector. A plurality of images are taken, each with the sample rotated about a rotation axis 14 by a different amount, and combined to create a computed tomography image.
Inventors:
Millen Gateshki
Detlef Beckers
Detlef Beckers
Application Number:
JP2017248596A
Publication Date:
March 10, 2021
Filing Date:
December 26, 2017
Export Citation:
Assignee:
Malvern Panaltical BV
International Classes:
G01N23/046; A61B6/03; G21K1/04; G21K5/02; H05G1/00
Domestic Patent References:
| JP2006524548A | ||||
| JP2011507672A | ||||
| JP2012517587A |
Foreign References:
| US20090190714 | ||||
| US20120140897 |
Attorney, Agent or Firm:
Tadashige Ito
Tadahiko Ito
Shinsuke Onuki
Tadahiko Ito
Shinsuke Onuki