Title:
CONDUCTIVITY MEASURING DEVICE
Document Type and Number:
Japanese Patent JP2021018223
Kind Code:
A
Abstract:
To provide a conductivity measuring device capable of improving the measurement accuracy of surface or interface conductivity at high frequencies.SOLUTION: In the conductivity measuring device for measuring the conductivity of conductor surface or interface by the dielectric resonator method, as shown in Fig. 4 (B), holes 12a and 12b are formed on the side surface of the dielectric cylinder 12, which has the upper surface and the lower surface where the two conductor plates 11a and 11b are in contact, at least one of which is the measurement target, and one end of the excitation lines 13a, 13b is inserted into the holes 12a, 12b (the other ends of the excitation lines 13a and 13b are electrically connected to a high-frequency measuring device).SELECTED DRAWING: Figure 4(B)
Inventors:
FUKUMORI HIROMASA
Application Number:
JP2019135976A
Publication Date:
February 15, 2021
Filing Date:
July 24, 2019
Export Citation:
Assignee:
FUJITSU LTD
International Classes:
G01R27/26; H01P7/10
Attorney, Agent or Firm:
Fuso International Patent Office