To provide a contact probe and an inspection socket which enable sliding property and electric resistance of the contact probe to be stabilized to improve productivity and enable inspection of an object to be inspected stably.

A contact probe includes a first conductive member 14 having an electric contact part 18 and a plunger 17 integrally provided with the electric contact part, a cylinder part 19 having an electric contact part 20 and an through-hole 19a which is integrally provided with the electric contact part and into which the plunger is slidably inserted, and a coil spring which is interposed between the first conductive member and a second conductive member 15 and which biases in a direction where the electric contact part is separated when the plunger slides in the through-hole so that the electric contact part comes close. The electric contact part is contacted with a connecting terminal of a print wiring board 23, and is contacted with a connecting terminal of the object to be inspected. The plunger is made bent.