To provide a contact probe pin capable of securing reliability, while keeping superior high-frequency characteristics, and to provide a contact probe pin that can be manufactured with productivity.

This contact probe pin is equipped with a conductive barrel, equipped with a hollow part having an opening part at least on one side; a conductive plunger arranged slidably in the electrical contact state with the inside surface of the barrel; and a spring, arranged expandably/contractibly between a projection part provided on the outside surface other than the sliding region to the barrel of the plunger and a projection part provided on the outside surface of the barrel, while involving the barrel.

COPYRIGHT: (C)2007,JPO&INPIT