Title:
CONTACT PROBE
Document Type and Number:
Japanese Patent JP2011002267
Kind Code:
A
Abstract:
To attain stable contact of a contact pin with a probing object.
This contact probe 1 includes a sleeve 2 and the contact pin 4 which has a plurality of projections 14 formed in the end face of a tip part 11 to be brought into contact with a probing point and of which the rear end side is inserted slidably into the sleeve 2. The tip part 11 of the contact pin 4 is formed of a cylindrical body which opens on the probing point side, and the projections 14 are constituted by forming a part on the probing point side in the peripheral wall 11a of the cylindrical body in the shape of teeth.
Inventors:
ABE NOBUYUKI
WAKABAYASHI KAZUYOSHI
TSUCHIYA HIROSHI
HANAOKA HIDEHIKO
ISHIDA TADASHI
OGAWARA TAKAHIRO
SANO TAKAHIRO
TOMOI TADASHI
WAKABAYASHI KAZUYOSHI
TSUCHIYA HIROSHI
HANAOKA HIDEHIKO
ISHIDA TADASHI
OGAWARA TAKAHIRO
SANO TAKAHIRO
TOMOI TADASHI
Application Number:
JP2009143820A
Publication Date:
January 06, 2011
Filing Date:
June 17, 2009
Export Citation:
Assignee:
HIOKI ELECTRIC WORKS
International Classes:
G01R1/067; G01R31/26
Domestic Patent References:
| JP2003526874A | 2003-09-09 | |||
| JP2005221309A | 2005-08-18 | |||
| JP2009180549A | 2009-08-13 |
Attorney, Agent or Firm:
Shinji Sakai
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