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Patent Searching and Data


Title:
CONTACT TERMINAL FOR CONTACT PROBE PIN
Document Type and Number:
Japanese Patent JP09119945
Kind Code:
A
Abstract:

To provide a contact terminal for contact probe pin with a small diameter for testing a narrow-pitch probe which has a high mechanical strength and stiffness and hence cannot be bent, has an improved toughness and hence cannot be damaged, has an improved wear resistance, has an improved corrosion resistance, and an improved conductivity and a stable contact electrical resistance.

Work-hardening or age-hardening type Co-Ni group alloy or Co-Ni group alloy 4 which consists of 20-40% Cr+Mo, 20-50% Ni, 25-45% Co, 0.1-5% each of Mn, Ti, Al, and Fe, 0.1-3% Nb, and 0.01-1% rare earth elements type 1 or type 2 or more being selected from among Ce, Y, and misch metal, 0.1-1% V, and 0.05-0.2% C in terms of weight ratio is machined into the shape of a contact terminal using a wire which is subjected to cold wiredrawing working with at least 50% degree of working. Then, age-hardening is performed at 400-600°C, thus forming, for example, Ni-P or Ni-B compound plating layer 5 with improved conductivity, high hardness, and wear resistance on the surface.


Inventors:
Takahashi, Osamu
Application Number:
JP1995000276034
Publication Date:
May 06, 1997
Filing Date:
October 24, 1995
Export Citation:
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Assignee:
S I I MICRO PARTS:KK
International Classes:
G01R1/067; B21C1/00; C22C19/03; C22C19/07; G01R1/067; B21C1/00; C22C19/03; C22C19/07; (IPC1-7): G01R1/067; B21C1/00; C22C19/03; C22C19/07