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Title:
CONTACT TYPE PROBE
Document Type and Number:
Japanese Patent JPS63117268
Kind Code:
A
Abstract:

PURPOSE: To enable use for a circuit pattern with a closer circuit pitch, by arranging a probe section for contacting an object to be measured and an energizing section for pressing on the object being measured.

CONSTITUTION: A contact type probe consists of a probe section 1 and an energizing section 2. The probe section 1 is made up of a flexible tube 5 through which a wire 4 contacting a circuit 3b of a circuit board 3a in an object 3 to be measured is inserted slidably and a fixing material 6 for fixing the tube 5. The energizing section 2 has an energizing body 7 which abuts the rear end of the wire 4 to press the tip of the wire 4 on the circuit 3b and the energizing body 7 is provided with a plunger 7a. Then, the tip of wire 4 gets in contact with the circuit 3b and then, wire 4 is made to slide so that the plunger 7a abutting a head 4a provided at the rear end of the wire 4 presses the energizing body 7. Thus, the tip of the wire 4 can be pressed on the circuit 3b under a proper pressure by an energizing force of the energizing body 7 against the pressing force of the plunger 7a.


Inventors:
YOSHIDA KOICHI
Application Number:
JP26244986A
Publication Date:
May 21, 1988
Filing Date:
November 04, 1986
Export Citation:
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Assignee:
YOSHIDA KOICHI
International Classes:
G01R1/067; G01R1/073; H01L21/66; (IPC1-7): G01R1/067; H01L21/66
Attorney, Agent or Firm:
Dozo Isono



 
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