Title:
導通検査具の導通ピン保護構造
Document Type and Number:
Japanese Patent JP4921348
Kind Code:
B2
Abstract:
A conduction check apparatus including an inspection part (4) having a main body (22) having a surface (23a), inspection pins (21) protruded from the surface (23a), a guide pin (8) provided on the surface (23a); and a protection board 6 sliding along the guide pin (8) from a first position to a second position and having a plurality of holes (28). At the first position, the protection board (6) covers a tip of each of the inspection pins (21) and, at the second position, each of the inspection pins (21) jut out from the respective one of the holes (28). The conduction check apparatus includes a connector setting part (3) relatively moving toward the inspection part (4). The protection board (6) moves between the first and the second position during the relative movement.
Inventors:
Hideyuki Kato
Application Number:
JP2007341197A
Publication Date:
April 25, 2012
Filing Date:
December 28, 2007
Export Citation:
Assignee:
Yazaki Corporation
International Classes:
H01R43/00; G01R31/04
Domestic Patent References:
| JP2002343527A | ||||
| JP200437164A |
Attorney, Agent or Firm:
Hideo Takino
Sadao Matsumura
Fumio Takino
Sadao Matsumura
Fumio Takino