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Title:
CONTROL CIRCUIT FOR SEMICONDUCTOR DEVICE WITH SUPERHEATING PROTECTION FUNCTION
Document Type and Number:
Japanese Patent JP3585105
Kind Code:
B2
Abstract:

PROBLEM TO BE SOLVED: To provide the control circuit of a semiconductor device with superheating protection function, which ca reduce possibility that the semiconductor device is destroyed.
SOLUTION: The control circuit of the semiconductor device with superheating protection function has a control means 1 and an output state detection means 5 for controlling the semiconductor device with superheating protection function 3, which loads a semiconductor component 33 and superheating protection means 34 to 37 on a one chip. The control means 1 supplies a PWM control signal to the semiconductor component 33. The output state detection means 5 detects the output abnormal state of the semiconductor device with superheating protection function 3 in the superheating protection operation of the superheating protection means 34 to 37. The control means 1 monitors detection output from the output state detection means 5 at prescribed monitoring timing. When the prescribed number of detection outputs continuously occur for prescribed time, the supply of the PWM control signal to the semiconductor component 33 is controlled to be stopped.


Inventors:
Shigeo Yamaji
Application Number:
JP34850099A
Publication Date:
November 04, 2004
Filing Date:
December 08, 1999
Export Citation:
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Assignee:
Yazaki Corporation
International Classes:
H01L21/822; H01L21/8234; H01L27/088; H02H3/087; H02H5/04; H02H7/20; H03K17/08; H03K17/082; H01L27/04; H03K17/18; (IPC1-7): H01L21/822; H01L21/8234; H01L27/04; H01L27/088; H02H3/087; H02H5/04; H02H7/20; H03K17/08
Domestic Patent References:
JP7174393A
Attorney, Agent or Firm:
Hideo Takino
Hiroshi Ochi
Sadao Matsumura
Isamu Kakiuchi