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Patent Searching and Data


Title:
CORRECTION METHOD OF ANALYSIS DEVICE
Document Type and Number:
Japanese Patent JPS5598318
Kind Code:
A
Abstract:

PURPOSE: To carry out high precision correction by the use of an easily available element, by obtaining the change in sensitivity from a first sample and a maximum sensitivity wave length from a second sample.

CONSTITUTION: A first standard sample having a plain spectroscopic transmission characteristic and a second standard sample having an inclining characteristic are prepared. A first standard sample is charged in an analysis device to be corrected to obtain a maiximum sensitivity SmaxR of the reference light side and a maximum sensitivity SmaxM of the measuring light side. By comparing them with a previously recorded initial value, the change amount ΔSmaxR and ΔSmaxM are obtained and it is compared with the initial value to obtain ΔλmaxM. Thus, from the representative characteristic view, the precisely correct value can be obtained.


Inventors:
INOUE MASAAKI
YAMADA HITOSHI
KIYOBE SEIICHIROU
Application Number:
JP643579A
Publication Date:
July 26, 1980
Filing Date:
January 19, 1979
Export Citation:
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Assignee:
YOKOGAWA ELECTRIC WORKS LTD
International Classes:
G01J3/42; G01N21/17; G01N21/27; G01N21/35; (IPC1-7): G01J3/42; G01N21/17