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Patent Searching and Data


Title:
COUNTER TEST METHOD
Document Type and Number:
Japanese Patent JPH0376314
Kind Code:
A
Abstract:

PURPOSE: To allow the method with the less member of patters for test and not to decrease a maximum operating frequency at the time of testing by controlling a clock, a reset signal and a carry-in signal for each counter for an object to be tested so as to conduct the test.

CONSTITUTION: Outputs of a 12-bit counter exist in 4096 ways by permutation of 12 bits, but test is conducted for 4-bit output each of the counter through the division of the counter constitution, then test patters required only 16×3=48 ways. The operating limit frequency fmax of the period counter is expressed in equation I, where Tpd is a propagation delay time of the counter, Tsu is a set up time and Tskew is a skew of the clock. The skew Tskew is suppressed small because of the limited effect only in the wiring coverage length in a gate array, thereby improving the operating limit frequency fmax.


Inventors:
TSUNEOKA TAKASHI
Application Number:
JP21175089A
Publication Date:
April 02, 1991
Filing Date:
August 17, 1989
Export Citation:
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Assignee:
YOKOGAWA ELECTRIC CORP
International Classes:
H03K21/40; H03K21/00; (IPC1-7): H03K21/00
Attorney, Agent or Firm:
Masayasu Watanabe



 
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