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Patent Searching and Data


Title:
CRACK INSPECTION METHOD AND CRACK INSPECTION DEVICE
Document Type and Number:
Japanese Patent JP2005214893
Kind Code:
A
Abstract:

To provide a crack inspection method capable of eliminating a determination trouble resulting from a personal error of a worker, and capable of enhancing a yield up to a fixed level or more.

This crack inspection method has an oscillation step for applying a prescribed frequency and a prescribed intensity of vibration to an inspection object, on condition of inspecting that whether a crack is generated in the inspection object having a standardized form or not; a waveform detecting step for detecting a waveform correlated with the vibration of the inspection object under an oscillated condition; a feature amount extracting step for extracting a feature amount correlated with the presence of the crack from the extracted waveform; and a determination step for determining the presence of the crack in the inspection object, based on the comparison of the extracted feature amount with a prescribed reference value.


Inventors:
Oikawa, Takahiro
Inoue, Yuichi
Application Number:
JP2004000024699
Publication Date:
August 11, 2005
Filing Date:
January 30, 2004
Export Citation:
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Assignee:
OMRON CORP
International Classes:
G01N29/12; G01M7/02; G01N29/12; G01M7/00; (IPC1-7): G01M7/02; G01N29/12