Title:
CRITICALITY DETECTOR
Document Type and Number:
Japanese Patent JP3274206
Kind Code:
B2
Abstract:
PURPOSE: To detect both fast and slow critical phenomena using a single radiation detector.
CONSTITUTION: The criticality detector for converting radiation into an analog radiation dose rate and detecting a fast criticality using an analog comparison circuit 24 further comprises an A-D converting means 26 for converting the analog signal converted through the radiation detecting means 21 into a digital signal, means 29 for accumulating thus converted digital signal for every predetermined time interval and storing the accumulated signal, a digital comparison circuit 30 for comparing the accumulated value stored in the accumulating means 29 with a preset digital accumulated value trip level, and a slow criticality detecting means 23 for outputting a trip signal when the accumulated value exceeds the trip level.
Inventors:
Takashi Sasaki
Application Number:
JP1992693A
Publication Date:
April 15, 2002
Filing Date:
February 08, 1993
Export Citation:
Assignee:
Toshiba Corporation
International Classes:
G01T1/17; G08B19/00; G21C17/06; G21C19/40; (IPC1-7): G21C17/06; G01T1/17
Domestic Patent References:
| JP6097296A | ||||
| JP2143195A | ||||
| JP5288859A | ||||
| JP4279891A |
Attorney, Agent or Firm:
Takehiko Suzue