Title:
CULTURE OBSERVATION SYSTEM
Document Type and Number:
Japanese Patent JP2007334141
Kind Code:
A
Abstract:
To provide a culture observation system by which round dimensions of cells observed through a microscope under culture are recognized at one view.
The culture observation system S comprises: a cultivator 2 for constituting an environment suitable for culture of cells; an imaging device 3 for taking a microscope image of cells; a display 4 for displaying a taken microscope image; and a computer 5 which controls the display of the display 4, wherein the computer 5 movably displays a predetermined scale in a microscope image displayed on the display 4.
COPYRIGHT: (C)2008,JPO&INPIT
Inventors:
NAKAMURA SHIGEYUKI
BUSUJIMA HIROKI
BUSUJIMA HIROKI
Application Number:
JP2006167694A
Publication Date:
December 27, 2007
Filing Date:
June 16, 2006
Export Citation:
Assignee:
SANYO ELECTRIC CO
International Classes:
G02B21/36; C12M1/00; C12M1/34; C12M3/00; H04N5/225
Domestic Patent References:
JPH0628724A | 1994-02-04 | |||
JPH08101354A | 1996-04-16 | |||
JPH09196621A | 1997-07-31 | |||
JP2006011415A | 2006-01-12 | |||
JP2000137158A | 2000-05-16 | |||
JP2006055027A | 2006-03-02 | |||
JP2004258495A | 2004-09-16 | |||
JP2004145302A | 2004-05-20 | |||
JPH0628724U | 1994-04-15 |
Attorney, Agent or Firm:
Kei Amekasa
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