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Title:
CULTURE OBSERVATION SYSTEM
Document Type and Number:
Japanese Patent JP2007334141
Kind Code:
A
Abstract:

To provide a culture observation system by which round dimensions of cells observed through a microscope under culture are recognized at one view.

The culture observation system S comprises: a cultivator 2 for constituting an environment suitable for culture of cells; an imaging device 3 for taking a microscope image of cells; a display 4 for displaying a taken microscope image; and a computer 5 which controls the display of the display 4, wherein the computer 5 movably displays a predetermined scale in a microscope image displayed on the display 4.

COPYRIGHT: (C)2008,JPO&INPIT


Inventors:
NAKAMURA SHIGEYUKI
BUSUJIMA HIROKI
Application Number:
JP2006167694A
Publication Date:
December 27, 2007
Filing Date:
June 16, 2006
Export Citation:
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Assignee:
SANYO ELECTRIC CO
International Classes:
G02B21/36; C12M1/00; C12M1/34; C12M3/00; H04N5/225
Domestic Patent References:
JPH0628724A1994-02-04
JPH08101354A1996-04-16
JPH09196621A1997-07-31
JP2006011415A2006-01-12
JP2000137158A2000-05-16
JP2006055027A2006-03-02
JP2004258495A2004-09-16
JP2004145302A2004-05-20
JPH0628724U1994-04-15
Attorney, Agent or Firm:
Kei Amekasa