Title:
データ解析装置、データ解析方法、及びプログラム
Document Type and Number:
Japanese Patent JP7235111
Kind Code:
B2
Abstract:
A data analysis apparatus 10 includes; an align unit 11 that acquires a pair data of a first data indicating a characteristic of a specific region and a second data corresponding to the first data and indicating another characteristic of the specific region, and aligns the first data in order of their sizes, a classification model generation unit that groups the pair data based on a characteristic of an order distribution of the first data after alignment, classifies the pair data, and generates a classification model for classifying the pair data using the classification result, a regression model generation unit that performs machine learning for each group, using the first data constituting the pair data and the second data constituting the same pair data, and generates a regression model indicating a relation with the first data and the second data.
Inventors:
Huang Akira
Application Number:
JP2021528631A
Publication Date:
March 08, 2023
Filing Date:
June 21, 2019
Export Citation:
Assignee:
NEC
International Classes:
G06N20/00; G01V8/02
Domestic Patent References:
| JP2000002769A |
Foreign References:
| WO2018216623A1 | ||||
| WO2012086443A1 |
Attorney, Agent or Firm:
Patent Attorney Corporation Britus