Title:
データ駆動型検査用フレームワーク
Document Type and Number:
Japanese Patent JP6723989
Kind Code:
B2
Abstract:
An apparatus for testing applications includes a data-processing machine including a memory and a processor operably coupled to the memory. The data-processing machine is configured to implement a data-driven testing framework that includes a data engineering module, a computational environment manager, and a result analysis module. The data engineering module is configured to create engineered test data based at least in part on the application to be tested. The computational environment manager is configured to control a computational environment in which the application is to operate on the engineered test data. The result analysis module is configured to compare engineered test data operated upon by the application with an expected output.
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Inventors:
Prints philippe
Isman Marshall Alan
Isman Marshall Alan
Application Number:
JP2017513040A
Publication Date:
July 15, 2020
Filing Date:
September 04, 2015
Export Citation:
Assignee:
Avinisio Technology LLC
International Classes:
G06F11/36
Domestic Patent References:
JP2006252158A | ||||
JP2012190063A | ||||
JP2009205239A | ||||
JP2010250669A | ||||
JP2013105358A |
Foreign References:
US20140222752 |
Attorney, Agent or Firm:
Masaki Hirota
Seiji Ozawa
Yusaku Tokai
Kazuhiro Matsuda
Makoto Horiuchi
Masako Yamauchi
Shuichi Sonomoto
Akihiro Yamamura
Satoshi Morikawa
Hiroyuki Tomita
Seiji Ozawa
Yusaku Tokai
Kazuhiro Matsuda
Makoto Horiuchi
Masako Yamauchi
Shuichi Sonomoto
Akihiro Yamamura
Satoshi Morikawa
Hiroyuki Tomita