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Title:
DATA PROCESSING METHOD AND APPARATUS FOR CHARACTERISTICS MEASUREMENT OF PHOTON DETECTION DEVICE AND PHOTON RECEIVER USING IT
Document Type and Number:
Japanese Patent JP2007147472
Kind Code:
A
Abstract:

To provide a data processing method and apparatus and a measuring apparatus and method for obtaining accurate characteristics possessed by a photon detection device.

Wave height histograms when photons are input and at dark are generated from output signals of an APD 102. Discrimination efficiencies DPD, DDK are generated from the wave height diagrams, respectively. Using the discrimination efficiencies DPD, DDK as correction coefficients for an equation calculating the predetermined characteristics of the APD from a counted value discriminating the APD output allows characteristics calculations considering the probability of discrimination failure, thereby obtaining accurate characteristics of the APD. Moreover, the ratio between or the maximum value of the difference between the discrimination efficiencies DPD, DDK can determine an optimum discrimination threshold.


Inventors:
TAKAHASHI SEIGO
TAJIMA AKIO
TANAKA AKITOMO
MAEDA WAKAKO
Application Number:
JP2005343134A
Publication Date:
June 14, 2007
Filing Date:
November 29, 2005
Export Citation:
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Assignee:
NEC CORP
International Classes:
G01J1/00; G01J1/02; G01J1/42; G01M11/00
Attorney, Agent or Firm:
Yuji Katsuragi