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Patent Searching and Data


Title:
DEFECT CORRECTION METHOD AND DEVICE
Document Type and Number:
Japanese Patent JP2010044231
Kind Code:
A
Abstract:

To provide a defect correction method, decreasing a resistance value of a correcting part.

According to this defect correction method, a correction layer 5 containing metal material is formed to cover a breaking of wire defect part 3 of a wire 2 formed on a glass substrate 1 and part of a normal part of the wire 2 existing at both ends thereof, laser light is applied to each of two overlapping regions of the correction layer 5 and the wire 2, thereby welding the correction layer 5 and the wire 2 to each other in the respective regions. Thus, even when an oxidation layer exists on the surface of the wire 2, the correction layer 5 and the wire 2 are fused and fixed in the respective regions so that the resistance value of the correcting part can be decreased.


Inventors:
SHIMIZU SHIGEO
Application Number:
JP2008208432A
Publication Date:
February 25, 2010
Filing Date:
August 13, 2008
Export Citation:
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Assignee:
NTN TOYO BEARING CO LTD
International Classes:
G09F9/00; G02F1/1343
Attorney, Agent or Firm:
Kuro Fukami
Toshio Morita
Yoshihei Nakamura
Yutaka Horii
Hisato Noda
Masayuki Sakai
Nobuo Arakawa