DEFECT DETECTION SYSTEM AND IMAGE FORMATION DEVICE, AND DEFECT DETECTION METHOD

Title:

DEFECT DETECTION SYSTEM AND IMAGE FORMATION DEVICE, AND DEFECT DETECTION METHOD

Document Type and Number:

Japanese Patent JP2015054485

Kind Code:

A

Abstract:

PROBLEM TO BE SOLVED: To make it possible to reliably detect presence or absence of a defect of an electrical product with simple processing and prevent increase of the defect.SOLUTION: Supply and stop of an electric power source 43, which is supplied to an electrical product 50 via a power line 61 of a harness 60 by a supply/stop change circuit 42 provided on a control board 40, can be changed, and such a change is controlled by a control part 41. During supply of the electric power source to the electrical product 50 is stopped by such a configuration, a signal value of a signal, which is inputted to an input terminal 41s of the control part 41 from the electrical product 50 via a signal line 62 of the harness 60, and an expectation value of the signal in the case that the electrical product 50 and the harness 60 are normal are compared by determination means, and when the results thereof are inconsistent, it is determined that the electrical product 50 or the harness 60 is deficient.

Inventors:

KOSOEGAWA EMIKO
TAKANE TOSHIAKI
SHIRASAKI YOSHINORI

Application Number:

JP2013190164A

Publication Date:

March 23, 2015

Filing Date:

September 13, 2013

Export Citation:

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