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Title:
DEFECT INSPECTION METHOD AND DEFECT INSPECTION DEVICE OF SEALED HONEYCOMB STRUCTURE
Document Type and Number:
Japanese Patent JP2009085673
Kind Code:
A
Abstract:

To provide a defect inspection method and a defect inspection device of a sealed honeycomb structure, capable of specifying the position of a cell having a defect and of readily grasping the defect size.

In this method for inspecting a penetration defect of a sealed honeycomb structure 1 equipped with a honeycomb structure 2, wherein a plurality of cells 9 communicated between two end faces are partitioned and formed by a porous bulkhead 7, and a sealing part 11 disposed so as to seal either of two opening ends of each cell 9, particles 51 for quantification having a prescribed particle size range are introduced into the cell 9 from either end face; the number and the particle size of the particles 51 for quantification passing a penetration defect 17 and discharged from the end face on the opposite side are measured relative to each cell having the defect through which the particles are discharged; and the defect size is quantified from the measured number and particle size of the particles 51 for quantification.


Inventors:
MIYASHITA KOICHI
MIZUNO YUKIO
Application Number:
JP2007253529A
Publication Date:
April 23, 2009
Filing Date:
September 28, 2007
Export Citation:
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Assignee:
NGK INSULATORS LTD
International Classes:
G01N15/08
Domestic Patent References:
JP2004286703A2004-10-14
JP2002357562A2002-12-13
Foreign References:
WO2007015810A22007-02-08
Attorney, Agent or Firm:
Ippei Watanabe