To provide a defective factor extraction method capable of maintaining reliability of defective factor extraction results even if the number of manufacturing devices assumed as the defective factor is large.
In a defective factor extraction device, process data including information indicating manufacturing devices in which each part manufacturing process is performed per products is associated with inspection data and stored as a data set (S1). When any of the part manufacturing process is designated (S4), statistics related to variation of the inspection data on the products processed by each of the manufacturing devices are calculated based on the data set per the manufacturing devices (S5). A calculation for matching the statistics per the manufacturing device to the data set and the goals is performed and an influence on the variation of the inspection data dependent on the manufacturing devices is removed from the data set while maintaining the number of data in the data set (S6, S7). A causal factor is extracted by using the calculated data set (S2).
Mitsuo Tanaka
Yukinori Nakakura
Next Patent: INFORMATION PROCESSING DEVICE AND COMPUTER PROGRAM