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Title:
DEFECTIVENESS INSPECTION DEVICE
Document Type and Number:
Japanese Patent JPH04145351
Kind Code:
A
Abstract:

PURPOSE: To improve defectiveness detecting precision, by conducting inspection by using a different inspection condition set at every lane or block.

CONSTITUTION: At a memory means 60, optimum inspection condition sets used at every lane, I, II,....VI are memorized. A scanning lane discrimination means 64 discriminates which lane a scanning position on a main scanning line 32 is in. A selecting means 66, when a lane signal β is 'I', selects an inspec tion condition set I opposing this lane I from the means 60. Also, when the signal β becomes 'II', the means 60 selects an inspection condition II. Thus, inspection conditions I, II - VI to be selected are changed in opposition to the scanning position being changed to respective lanes I, II - V. A changeover means 68 delivers to respective portions inspection conditions selected by means of the means 66 by conducting reading from the means 60.


Inventors:
IWASA MASAKAZU
SONE SHIRO
Application Number:
JP26913990A
Publication Date:
May 19, 1992
Filing Date:
October 05, 1990
Export Citation:
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Assignee:
FUJI PHOTO FILM CO LTD
International Classes:
G01N21/88; G01N21/89; G01N21/892; H04N7/18; (IPC1-7): G01N21/88; G01N21/89; H04N7/18
Domestic Patent References:
JPH01239439A1989-09-25
Attorney, Agent or Firm:
Fumio Yamada (1 person outside)