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Title:
DELAY PROFILE MEASURING INSTRUMENT
Document Type and Number:
Japanese Patent JP2000115087
Kind Code:
A
Abstract:

To find propagation conditions without using a special radio wave and a special receiver by using an existent radio wave.

An FFT(fast Fourier transform) computing element 1 converts a base-band signal to a frequency-axis signal through an FFT process and a pilot signal extractor 2 extracts only a pilot signal for amplitude and phase equalization which is arranged on the frequency axis from the frequency axis signal outputted from the FFT computing element 1. Then an amplitude and phase frequency characteristic detector 3 interpolates the pilot signal for amplitude and phase equalization and generates and outputs a frequency characteristic signal regarding the amplitude and phase. An IFFT(inverse fast Fourier transformation) computing element 4 finds the time-base signal of the output of the amplitude and phase frequency characteristic detector 3 and detects the electric energy to a delay time. The electric energy which is thus detected is displayed as a delay profile on a display unit 5 in a predetermined form and saved in a data storage device 6 when necessary.


Inventors:
TAKAHASHI YASUO
SUGA TAKU
HIRAKURA TAKAO
Application Number:
JP27852998A
Publication Date:
April 21, 2000
Filing Date:
September 30, 1998
Export Citation:
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Assignee:
JISEDAI DIGITAL TELE HOSO SYS
TOSHIBA CORP
International Classes:
H04B17/00; H04B17/364; H04J11/00; (IPC1-7): H04B17/00
Attorney, Agent or Firm:
Takehiko Suzue (6 outside)