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Title:
PILE OF OXIDE THIN FILM
Document Type and Number:
Japanese Patent JP2018100446
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a method for piling up an oxide thin film.SOLUTION: In a method for piling up a thin film on a first surface selectively to a second surface of a substrate, an oxide thin film containing an insulating metal oxide is formed by bringing the substrate into contact with a first vapor-phase precursor containing an organic metal, by exposing the substrate to purge gas or vacuum after bringing the substrate into contact with the first vapor-phase precursor, and by exposing the substrate to a second vapor-phase precursor containing molecular oxygen (O) after exposing the substrate to purge gas or vacuum.SELECTED DRAWING: Figure 1

Inventors:
SUVI P HAUKKA
ELINA FARM
RAIJA H MATERO
EVA E TOIS
SUEMORI HIDEMI
ANTTI JUHANI NISKANEN
JUNG SUNG HOON
PETRI RAISANEN
Application Number:
JP2017222532A
Publication Date:
June 28, 2018
Filing Date:
November 20, 2017
Export Citation:
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Assignee:
ASM IP HOLDING BV
International Classes:
C23C16/40; C23C16/455; H01L21/31; H01L21/316
Domestic Patent References:
JP2010540773A2010-12-24
JP2004281479A2004-10-07
JP2010232316A2010-10-14
JP2009539237A2009-11-12
JP2010518644A2010-05-27
Foreign References:
US20100270626A12010-10-28
US20150217330A12015-08-06
WO2016147941A12016-09-22
US20090081827A12009-03-26
Other References:
K.KUKLI ETAL: "Properties of hafnium oxide films grown by ALD from hafnium tetraiodide and oxgen", J.APPL.PHYSICS, vol. 92, JPN7021003931, 2002, pages 5698, ISSN: 0004600581
Attorney, Agent or Firm:
Takashi Onodera