Title:
【発明の名称】物体の3次元形状測定方法及び装置
Document Type and Number:
Japanese Patent JP2003533685
Kind Code:
A
Abstract:
The invention relates to a method for determining the 3D profile of an object. In order to improve a method of this type, several sections of the object ( 5 ) are measured. During at least one measuring operation, at least one reference object ( 4 ) is measured. The measured sections of the object ( 5 ) are combined ( 1 ).
Inventors:
Armin Maidhof
Peter Andre
Manfred Adolhard
Michael Cousse
Marx Basel
Frank Toss
Marx Ratzer
Thomas naswetta
Hans Steinbiffler
Peter Andre
Manfred Adolhard
Michael Cousse
Marx Basel
Frank Toss
Marx Ratzer
Thomas naswetta
Hans Steinbiffler
Application Number:
JP2001584823A
Publication Date:
November 11, 2003
Filing Date:
May 16, 2001
Export Citation:
Assignee:
Steinbifler Opttehinik Gamebhaer
International Classes:
G01B11/00; G01B21/20; G01B11/25; (IPC1-7): G01B21/20; G01B11/25
Attorney, Agent or Firm:
Hiroshi Maeda (7 outside)