Title:
【発明の名称】分析装置、分析装置の試験要素支持体及び試験要素の洗浄方法
Document Type and Number:
Japanese Patent JP3068286
Kind Code:
B2
Abstract:
There is a need in analyzers for test elements to be removed from a processing station, washed and returned to that station. Described herein is shuttle apparatus (100) and method for catching a test element (E) ejected from an incubator (40), for carrying it to a station outside the incubator (40), for example, a wash station (70), and for returning it to a loading station (20). Preferably, the apparatus comprises a simplified catcher plate (110) and means (160) for moving the plate (110) in an arcuate path (112) around a portion of the circumference of the incubator (40). The plate (110) cooperates with stop means (180) disposed above the arcuate path (112), to capture a washed element upon reloading, so that the washed element can be reloaded by returning it to the original path used to load elements into the incubator (40) in the first instance.
Inventors:
James david show
Martin frank maszaku
Martin frank maszaku
Application Number:
JP30210191A
Publication Date:
July 24, 2000
Filing Date:
November 18, 1991
Export Citation:
Assignee:
Eastman Kodak Company
International Classes:
G01N35/00; G01N35/02; C12M1/34; G01N35/04; (IPC1-7): G01N35/04; G01N35/02
Domestic Patent References:
| JP149965A |
Attorney, Agent or Firm:
Aoki Akira (4 outside)