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Patent Searching and Data


Title:
DETECTING APPARATUS OF ABNORMALITY
Document Type and Number:
Japanese Patent JPH0395427
Kind Code:
A
Abstract:

PURPOSE: To make the time of occurrence of abnormality exact and to improve design precision and the reliability of a product by conducting a vibration test by giving a minute random wave to a vibration signal, and by detecting only a frequency signal of a resonant point of a test specimen.

CONSTITUTION: A test specimen 1 is vibrated 3 by a wave obtained by synthesizing 10 a sine wave from a transmitter 4 and a minute random wave from a random wave generator 9. A vibration speed is detected by a vibration sensor 6, amplified 7 and subjected to a frequency analysis and thereby a resonant point of the specimen can be detected. The frequency of this resonant point also changes due to a change in a spring constant which is caused by the occurrence of abnormality, such as the occurrence of a crack or loosening of a bolt, in the test specimen 1 in the course of a vibration test. A number of resonant points of this test specimen 1 are converted into electric signals through a plurality of band-pass filters 24 passing only the respective frequencies thereof and through F-V converters 25 converting signals of the frequencies into corresponding direct-current signals, and are stored. When a value set beforehand is reached, the test is discontinued automatically and the abnormality can be detected from a record.


Inventors:
GENKOU SHIYUNICHI
Application Number:
JP23206589A
Publication Date:
April 19, 1991
Filing Date:
September 07, 1989
Export Citation:
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Assignee:
FUJI ELECTRIC CO LTD
International Classes:
G01N7/00; (IPC1-7): G01N7/00
Attorney, Agent or Firm:
Yoshihide Komada