Title:
DETECTOR FOR DETECTING DEFECT IN MULTILAYERED FILM
Document Type and Number:
Japanese Patent JP2002250695
Kind Code:
A
Abstract:
To make a multilayered film held in an inspection portion.
This detector is provided with a roll 15 provided in a midway of a conveying line 11 for the multilayered film 12, of which the surface is mirror surface-finished, a lighting system 18 for emitting inspection light toward the roll 15, a sensor 19 for detecting reflected light from the roll 15 and the film 12, and an inspection device 20 for determining a defect, based on a signal from the sensor 19.
Inventors:
SHIGENOBU YASUSHI
Application Number:
JP2001050496A
Publication Date:
September 06, 2002
Filing Date:
February 26, 2001
Export Citation:
Assignee:
SEKISUI CHEMICAL CO LTD
International Classes:
G01N21/892; G01N21/89; (IPC1-7): G01N21/892