Title:
劣化診断装置、劣化診断システム、劣化診断方法、及び、プログラム
Document Type and Number:
Japanese Patent JP7334852
Kind Code:
B2
Abstract:
To provide a frequency of inspection for deterioration diagnosis of a part to have the deterioration thereof diagnosed, this deterioration diagnosis device is made to comprise: a deterioration information storage means for storing a degree of deterioration history for a structure part to be diagnosed; a deterioration speed calculation means for calculating the deterioration speed of the part on the basis of the history; a reference information acquisition means for acquiring reference information that is information to be used to calculate an inspection frequency; a frequency calculation means for calculating an inspection frequency for the part on the basis of the reference information and the deterioration speed; and an output means for outputting the calculated frequency.
Inventors:
Jumonji Nana
Maiko Hasegawa
Yosuke Kimura
Maiko Hasegawa
Yosuke Kimura
Application Number:
JP2022511719A
Publication Date:
August 29, 2023
Filing Date:
March 08, 2021
Export Citation:
Assignee:
NEC
International Classes:
G01M99/00; G01N17/00
Domestic Patent References:
| JP2019057192A | ||||
| JP2009244061A | ||||
| JP2009192221A |
Foreign References:
| WO2015166637A1 |
Attorney, Agent or Firm:
Masahiko desk
Keiji Kitajima
Keiji Kitajima