Title:
劣化診断支援システムおよび劣化診断支援方法
Document Type and Number:
Japanese Patent JP6423686
Kind Code:
B2
Inventors:
Fumitaka Yamazaki
Masahiro Otaki
Tatsuro Hatano
Masahiro Otaki
Tatsuro Hatano
Application Number:
JP2014219703A
Publication Date:
November 14, 2018
Filing Date:
October 28, 2014
Export Citation:
Assignee:
Ichthys Co., Ltd.
International Classes:
G01N21/84; G01M99/00; G01N17/00; G01N21/88; G01N29/265; G01N29/44
Domestic Patent References:
| JP2004294318A | ||||
| JP11132961A | ||||
| JP2013500222A | ||||
| JP2006266779A | ||||
| JP2005010248A | ||||
| JP2008107198A | ||||
| JP2007056505A |
Foreign References:
| US20130234030 | ||||
| US5757419 |
Attorney, Agent or Firm:
Shunsuke Umeda
Yukiko Kurita
Yukiko Kurita