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Title:
DEVICE FOR DETECTING THICKNESS OF MEDIUM BY CAPACITY MEASUREMENT
Document Type and Number:
Japanese Patent JP3648170
Kind Code:
B2
Abstract:

PROBLEM TO BE SOLVED: To provide a thickness detecting device for mechanically and easily detecting thickness of a medium, at a low cost without required maintenance required and independently of inductive or optical nature of the medium.
SOLUTION: There are provided first and second supporters 11 and 13 for relative movement, and a variable capacitor 15 provided with first and second electrodes 17 and 19 comprising a variable gap 21 and an inductive medium present in the variable gap 21. The inductive medium can be vacuum or gas. The first and second electrodes are installed as a part of the first and second supporters 11 and 13, substantially facing each other. A medium 23 whose thickness is to be measured and the supporters 11 and 13 are pressed to contact each other, resulting in the electrodes 17 and 19 being displaced to a second distance d2.


Inventors:
Karl E. Pitchot
Application Number:
JP2001122750A
Publication Date:
May 18, 2005
Filing Date:
April 20, 2001
Export Citation:
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Assignee:
HEWLETT-PACKARD COMPANY
International Classes:
G01B7/06; B41J11/00; B65H7/02; G01R27/26; (IPC1-7): G01B7/06
Domestic Patent References:
JP61118604A
JP61065109A
JP59145909A
Attorney, Agent or Firm:
Shoichi Okuyama
Arihara Koichi
Matsushima Tetsuo



 
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