Title:
DEVICE FOR DIAGNOSING FAILURE IN WAVEFORM SHAPING CIRCUIT
Document Type and Number:
Japanese Patent JP3204177
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide a device for diagnosing a failure in a waveform shaping circuit capable of diagnosing a failure in the waveform shaping circuit reliably even in a single waveform shaping circuit.
SOLUTION: Wheel velocity signals detected by four wheel velocity sensors FLS, FRS, RLS, and RRS each provided for a wheel are waveform-shaped by a waveform shaping circuit 14. In the case that output from the waveform shaping circuit 14 is absent for a predetermined period of time, a CPU 15 monitors the presence or absence of changes in the waveforms of the wheel velocity sensors inputted to an A/D converting part 17 at a frequency twice higher than a maximum wheel velocity frequency or more. Then on the basis whether there is a change by a predetermined value or more from a central value within a predetermined period of time in the voltage of a signal inputted to the A/D converting part 17, the waveform shaping circuit of wheel velocity is diagnosed. In the case that there is a change in the voltage by a predetermined value or more from the central value within a predetermined period of time, it is determined that the waveform shaping circuit 14 is faulty.
Inventors:
Toshio Taniai
Application Number:
JP27174197A
Publication Date:
September 04, 2001
Filing Date:
October 03, 1997
Export Citation:
Assignee:
NEC
International Classes:
G01P3/42; G01D5/244; G01D5/245; (IPC1-7): G01P3/42; G01D5/245
Domestic Patent References:
| JP577709A | ||||
| JP9251027A | ||||
| JP62156879U |
Attorney, Agent or Firm:
Nobuo Takahashi (3 outside)
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