Title:
DEVICE FOR INSPECTING CONTACT POINT GAP OF CONNECTOR
Document Type and Number:
Japanese Patent JP2793075
Kind Code:
B2
Abstract:
PURPOSE: To provide an inexpensive device having inspection capacity corresponding to assembly line capacity, which can make installation adjustment easy.
CONSTITUTION: A gage 53 is moved to and from a contact gap S, while moved in the direction perpendicular to the direction moved to and from. Therefore, all contact point gaps of a connector 10 at once can be inspected without reference to the number of poles of the connector 10, and inspection capacity is not varied with the number of poles of the connector 10. Contact gaps can be inspected without using an image processor; further the adjustment of the device also is not affected by the contacts and the surrounding state (reflection of light, etc.), as the image processor; and quantitative and easy adjustment can be made.
Inventors:
TSUCHA KUNIHIRO
Application Number:
JP11033292A
Publication Date:
September 03, 1998
Filing Date:
April 28, 1992
Export Citation:
Assignee:
MITSUBISHI ENPITSU KK
International Classes:
G01B3/30; G01B5/14; G01B21/00; G01B21/16; H01R13/64; (IPC1-7): G01B5/14; G01B3/30; G01B21/16; H01R13/64
Domestic Patent References:
| JP5937403A | ||||
| JP58151803A |
Attorney, Agent or Firm:
Hiroki Sasai
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