PURPOSE: To make inspection with high accuracy by providing a flaw detector which takes out a signal from a probe as an electric signal, and controls an unnecessary signal.
CONSTITUTION: The operator adjusts a digital micrometer 8 until the probe 2 contacts lightly with an ingot 1 and the space between the ingot 1 and the probe 2 is made "0"mm; thereafter, the operator returns the probe 2 by operating the micrometer 8 until the space 8 is made about 0.9mm. The space between the ingot 1 and the probe 2 can be easily measured by the micrometer 8 and adjustment can be made so that the relative position of the ingot 1 and the probe 2 does not change no matter where the ingot 1 exits. When a lower motor 3 is run in such a state, the probe 2 meshed with a ball screw 4 moves toward C along the ingot 1 and when the probe senses the part of the high Sn content existing deviatedly near the surface layer of the ingot 1, the electrical conductivity decreases lower than the electrical conductivity in the peripheral part thereof and the probe 2 emits a signal. The transmitted signal is taken out as the electric signal by the flaw detector; at the same time, the defective signal such as noise is controlled and is recorded on an X-Y recorder.
IWASE MASAZUMI
EGAWA HIDETOSHI
| JPS5689367A | 1981-07-20 | |||
| JPS5972055A | 1984-04-23 |