Title:
デバイス製造方法およびリソグラフィ装置、ならびに、コンピュータプログラム
Document Type and Number:
Japanese Patent JP4860679
Kind Code:
B2
Abstract:
In a lithographic printing process a substrate is moved, in the scanning direction, relative to a patterned beam of radiation being projected onto it during a scanning exposure of a pattern feature. An image of the pattern feature is blurred in the scanning direction. The effect of the blurring is used to reduce a difference of critical dimension between similar horizontal and vertical features. The effect on critical dimension may be obtained by providing an amount of anamorphic magnification to the projection system.
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Inventors:
Van Damme, Marinus, Johannes, Maria
Application Number:
JP2008282657A
Publication Date:
January 25, 2012
Filing Date:
November 04, 2008
Export Citation:
Assignee:
AS M Netherlands B.V.
International Classes:
H01L21/027; G03F7/20
Domestic Patent References:
JP6310399A | ||||
JP2000214382A | ||||
JP2003534652A | ||||
JP7183190A | ||||
JP8293463A | ||||
JP2002359184A | ||||
JP11003856A | ||||
JP8222495A | ||||
JP7183214A | ||||
JP2005292450A | ||||
JP8083744A |
Foreign References:
WO2004112107A1 | ||||
US5710619 |
Attorney, Agent or Firm:
Yoshiyuki Inaba
Toshifumi Onuki
Toshifumi Onuki