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Title:
DEVICE FOR MEASURING SURFACE POTENTIAL
Document Type and Number:
Japanese Patent JPH0572241
Kind Code:
A
Abstract:

PURPOSE: To eliminate the measuring error due to the temp. dependence of the change of the refractive index of a non-linear optical crystal or the deterioration of an electrostatic latent image by allowing linear polarized laser beam to be incident on the measuring head wherein the non-linear optical crystal is held between a measuring electrode and a rear electrode.

CONSTITUTION: A measuring head 14 is constituted by holding a non-linear optical crystal 26 between the measuring electrode 30 opposed to an object A to be inspected and a rear electrode 32. An electrostatic shield plate 34 having a fine hole 36 formed thereto is arranged to the rear surface of the measuring electrode 30 and the non-linear optical crystal 26 has Pockels effect changing the refractive index of said crystal corresponding to an electric field. Therefore, the surface potential of the object A to be inspected can be measured by forming the electric field corresponding to the surface potential of the object A to be inspected to the part corresponding to the fine hole 36 provided to the rear surface of the measuring electrode 30 of the non-linear optical crystal 26 in such a state that the measuring electrode 30 is opposed to the object A to be measured to change the refractive index of the non-linear optical crystal 26 and passing the measuring beam L of linear polarized beam having predetermined polarization to measure the polarization of the measuring beam L passing through the non-linear optical crystal 26.


Inventors:
FURUKAWA KOJI
MINAMI AKIRA
Application Number:
JP23473891A
Publication Date:
March 23, 1993
Filing Date:
September 13, 1991
Export Citation:
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Assignee:
FUJI PHOTO FILM CO LTD
International Classes:
G01R29/12; (IPC1-7): G01R29/12
Attorney, Agent or Firm:
Watanabe Noboru Minoru