To provide a device for evaluating a gas adsorption material capable of measuring adsorption profile of a gas adsorption material under a pressure-fixed condition in a low-temperature zone of an ambient temperature or less, and a method therefor.
The device 10 and the method using it for evaluating a gas adsorption material comprises a cryostat 20 for keeping a container 22 with a gas adsorption material accommodated therein at an arbitrary temperature at least from a boiling temperature of a gas to 300 K; a certain temperature retainer 30 for storing a gas emitted from the container 22 from a starting temperature to a gas's certain temperature; and a gas evolution volume measurement section 40 for measuring gas volume tentatively stored in the certain temperature retainer 30.
ITO AKIO
TANGE KYOICHI
TOYOTA MOTOR CORP
Kaoru Kobayashi