Title:
デバイス間接続試験回路生成方法、生成装置、および生成プログラム
Document Type and Number:
Japanese Patent JP5099119
Kind Code:
B2
Abstract:
A test circuit can use a simple test pattern data without customization for each substrate and considerably reduce a test preparation process. A connection test circuit is generated by receiving the input of the data of the connection relation indicating the devices mutually line-connected among a plurality of devices, the number of connection lines corresponding to the respective connection relations, and the device outputting a test result, sequentially searching for a connection destination device from the output terminal of an output device, and embedding a test circuit module in a test route.
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Inventors:
Koichi Tamai
Application Number:
JP2009503778A
Publication Date:
December 12, 2012
Filing Date:
March 15, 2007
Export Citation:
Assignee:
Fujitsu Semiconductor Limited
International Classes:
G01R31/28; G06F11/22; G06F11/28
Domestic Patent References:
| JPH1123667A | 1999-01-29 | |||
| JP2005283205A | 2005-10-13 | |||
| JPH1144741A | 1999-02-16 | |||
| JPH07174821A | 1995-07-14 |
Attorney, Agent or Firm:
Yoshiyuki Osuga
virtue Tamio Ei
virtue Tamio Ei