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Title:
光ビームの特性評価のためのデバイスおよび方法
Document Type and Number:
Japanese Patent JP6585093
Kind Code:
B2
Abstract:
A method for characterizing a light beam includes separating the light beam by a separator optic into first and second sub-beams; propagating the first and second sub-beams over first and second optics, respectively, said first and second optics being respectively arranged so that the sub-beams on leaving the optics are separated by a time delay τ; recombining the sub-beams so that they spatially interfere and form a two-dimensional interference pattern; measuring the frequency spectrum of at least part of the interference pattern; calculating the Fourier transform in the time domain of at least one spatial point of the frequency spectrum, the Fourier transform in the time domain having a time central peak and first and second time side peaks; calculating the Fourier transform in the frequency domain for one of the side peaks; calculating the spectral amplitude AR(ω) and the spatial-spectral phase φR(x,y,ω) for the Fourier transform in the frequency domain.

Inventors:
Kele, fabian
Galle, Balantin
Pariant, Gustave
Application Number:
JP2016573531A
Publication Date:
October 02, 2019
Filing Date:
June 15, 2015
Export Citation:
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Assignee:
Komisariya a Renergi Atomic E o Energy Alternate
International Classes:
G01J9/02; H01S3/00
Domestic Patent References:
JP2017519987A
Foreign References:
WO2006018897A1
US20140098367
US20030025911
Other References:
BENJAMIN ALONSO,FREQUENCY RESOLVED WAVEFRONT RETRIEVAL AND DYNAMICS OF DIFFRACTIVE FOCUSED ULTRASHORT PULSES,JOURNAL OF THE OPTICAL SOCIETY OF AMERICA - B,米国,OPTICAL SOCIETY OF AMERICA,2012年 8月 1日,VOL:29, NR:8,,PAGE(S):1993 - 2000,URL,http://dx.doi.org/10.1364/JOSAB.29.001993
CHRISTOPHE DORRER,SPECTRAL RESOLUTION AND SAMPLING ISSUES IN FOURIER-TRANSFORM SPECTRAL INTERFEROMETRY,JOURNAL OF THE OPTICAL SOCIETY OF AMERICA - B,米国,OPTICAL SOCIETY OF AMERICA,2000年10月 1日,VOL:17, NR:10,,PAGE(S):1795 - 1802,URL,http://dx.doi.org/10.1364/JOSAB.17.001795
Attorney, Agent or Firm:
Kawaguchi International Patent Office