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Title:
診断機能を備える装置、診断方法、およびプログラム
Document Type and Number:
Japanese Patent JP5249123
Kind Code:
B2
Abstract:

To provide an apparatus equipped with a diagnostic function not lowering device productivity.

There is provided the apparatus equipped with the diagnostic function for a plurality of diagnostic object points which includes an acquisition section acquiring respective diagnosis unwanted periods of the plurality of diagnostic object points and a diagnostic section selecting and diagnosing the diagnostic object point having passed the diagnosis unwanted period from among the plurality of diagnostic object points. This apparatus may further include a diagnostic interval storage section storing diagnostic intervals respectively corresponding to the plurality of diagnostic object points; and an update section updating the diagnosis unwanted period of the diagnostic object point diagnosed by the diagnostic section from among the plurality of diagnostic object points, based on the diagnostic interval corresponding to the diagnostic object point.

COPYRIGHT: (C)2011,JPO&INPIT


Inventors:
Yasukawa Kaju
Application Number:
JP2009114955A
Publication Date:
July 31, 2013
Filing Date:
May 11, 2009
Export Citation:
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Assignee:
Advantest Corporation
International Classes:
G01R31/28; G06F11/22
Domestic Patent References:
JP2007192586A
JP5296802A
Attorney, Agent or Firm:
Longhua International Patent Service Corporation



 
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