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Patent Searching and Data


Title:
DIAGNOSTIC CIRCUIT FOR UNIT PROVIDING CURRENT CONTROL AND PROTECTION AGAINST EXCESSIVE HEAT DISSIPATION FOR SEMICONDUCTOR POWER DEVICES
Document Type and Number:
Japanese Patent JPH02223672
Kind Code:
A
Abstract:

PURPOSE: To reduce a temperature in a join part of a power device by providing a means capable of sensing and corresponding to a temperature of the power device and acting on a reference voltage generator to reduce a reference voltage corresponding to a temperature rise exceeding a preset value.

CONSTITUTION: A first input 12 connected with a power device 5 and a second input 14 connected with a reference voltage generator 15 are input into a comparator 11. When an output of the comparator 11 exceeds a reference voltage, a signal generator 17 generates a diagnostic signal. A means 16 which senses a corresponds to a temperature of the power device 5 and acts on the reference voltage generator 15 so as to reduce the reference voltage corresponding to a temperature rise exceeding a set value is provided. Consequently, it is possible to reduce a temperature of a join part of the power device.


Inventors:
SERUJIO PARARA
Application Number:
JP32074289A
Publication Date:
September 06, 1990
Filing Date:
December 12, 1989
Export Citation:
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Assignee:
SGS THOMSON MICROELECTRONICS
International Classes:
F02P3/04; F02P3/055; F02P17/12; H02M9/00; F02P11/02; H03K17/082; H03K17/08; (IPC1-7): F02P3/04; F02P3/055; F02P11/02; H02M9/00
Attorney, Agent or Firm:
Shinichi Ogawa (2 outside)