Title:
DIRECT MAIL WITH DIAGNOSTIC TEST AND ADMISSION INVITATION METHOD USING THE SAME
Document Type and Number:
Japanese Patent JP2002067550
Kind Code:
A
Abstract:
To provide a direct mail capable of promoting effective invitation to the admission according to a response from a new member or his parent, and a method for inviting the admission.
A diagnostic test for a new member or his parent is provided to the direct mail (1). The diagnostic test includes a diagnostic test related to the learning aptitude of the new member or a diagnostic test related to the child growing characters of the parent of the new member. The diagnostic test is set so as to obtain diagnostic types as intermediate diagnostic results.
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Inventors:
KAGAWA HIROYASU
Application Number:
JP2000262392A
Publication Date:
March 08, 2002
Filing Date:
August 31, 2000
Export Citation:
Assignee:
TOPPAN FORMS CO LTD
International Classes:
B42D15/02; B42D11/00; B42D15/00; (IPC1-7): B42D15/02; B42D11/00; B42D15/00
Attorney, Agent or Firm:
Takao Yamaguchi
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