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Patent Searching and Data


Title:
DIRECT MAIL WITH DIAGNOSTIC TEST AND ADMISSION INVITATION METHOD USING THE SAME
Document Type and Number:
Japanese Patent JP2002067550
Kind Code:
A
Abstract:

To provide a direct mail capable of promoting effective invitation to the admission according to a response from a new member or his parent, and a method for inviting the admission.

A diagnostic test for a new member or his parent is provided to the direct mail (1). The diagnostic test includes a diagnostic test related to the learning aptitude of the new member or a diagnostic test related to the child growing characters of the parent of the new member. The diagnostic test is set so as to obtain diagnostic types as intermediate diagnostic results.


Inventors:
KAGAWA HIROYASU
Application Number:
JP2000262392A
Publication Date:
March 08, 2002
Filing Date:
August 31, 2000
Export Citation:
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Assignee:
TOPPAN FORMS CO LTD
International Classes:
B42D15/02; B42D11/00; B42D15/00; (IPC1-7): B42D15/02; B42D11/00; B42D15/00
Attorney, Agent or Firm:
Takao Yamaguchi