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Patent Searching and Data


Title:
DISCRIMINATION OF CHIP OF SEMICONDUCTOR DEVICE
Document Type and Number:
Japanese Patent JPH01241815
Kind Code:
A
Abstract:

PURPOSE: To make it possible to discriminate chips after chip dicing by adding a characteristic symbol to each semiconductor device.

CONSTITUTION: A semiconductor device is formed by repeating film forming, photoetching and impurity diffusion on a semiconductor substrate water 1. Next, electrode wiring is performed, after which a protective film is covered, and electrode terminals are formed by photoetching. In a photo process in which electrode terminals are formed, a characteristic symbol 3 is lithographed to the region in the semiconductor chip 2 except semiconductor elements at the same time as the patterning of element regions of the semiconductor device or the element region is lithographed, and etching is performed after development.


Inventors:
YOKOZAWA MINORU
Application Number:
JP6998488A
Publication Date:
September 26, 1989
Filing Date:
March 24, 1988
Export Citation:
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Assignee:
SEIKO EPSON CORP
International Classes:
H01L21/02; (IPC1-7): H01L21/02
Attorney, Agent or Firm:
Masanori Ueyanagi (1 outside)