Title:
DEVICE AND METHOD FOR TEST DATA GENERATION
Document Type and Number:
Japanese Patent JP3130877
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To easily generate test data, to reduce repairing operation due to misinput in signal information generation, and to shorten a test time.
SOLUTION: A user does not generate signal data 32 itself through an input device 1, but specifies environmental conditions of a test. A data processor 2 performs retrieval so that hierarchical data 31 in hierarchical structure stored to a storage device 3 are gradually narrowed down according to the condition specification and finally extracts the corresponding signal data 32. Consequently, the test data can automatically be generated without paying attention to the detailed contents of the signal data 32 and the work load on the tester is reduced.
Inventors:
Keiji Muramoto
Application Number:
JP30302898A
Publication Date:
January 31, 2001
Filing Date:
October 23, 1998
Export Citation:
Assignee:
NEC Communication Systems, Ltd.
International Classes:
G06F11/22; H04L69/40; (IPC1-7): G06F11/22; G06F11/22; H04L12/26; H04L29/14
Domestic Patent References:
| JP6175878A | ||||
| JP764815A | ||||
| JP649540A | ||||
| JP2213257A | ||||
| JP6205083A |
Attorney, Agent or Firm:
Nobuo Takahashi (3 outside)