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Title:
DOUBLE CONFOCAL SCANNING TYPE MICROSCOPE
Document Type and Number:
Japanese Patent JP2001356274
Kind Code:
A
Abstract:

To provide a double confocal scanning type microscope which can realize at least almost theoretically realizable resolution especially in association with polychromatic fluorescent use.

This invention relates to the double confocal scanning type microscope having an irradiation beam passage 2 of at least one light source 3 and a detection beam passage 4 of at least one detector 5. In particular, optical characteristics of elements 6, 10, 13 and 14 arranged at the beam passages are mutually adjusted so that accumulated aberration is at least as large as theoretically realizable resolution as to an optical axis 33 and/or at least one surfaces 18, 19 and 20 of a sample region.


Inventors:
ENGELHARDT JOHANN
BEWERSDORF JOERG
GUGEL HILMAR
HOFFMANN JUERGEN
Application Number:
JP2001105913A
Publication Date:
December 26, 2001
Filing Date:
April 04, 2001
Export Citation:
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Assignee:
LEICA MICROSYSTEMS
International Classes:
G01N21/64; G02B21/00; G02B21/06; (IPC1-7): G02B21/00; G01N21/64; G02B21/06
Attorney, Agent or Firm:
Kimura Takahisa