Title:
DRIVING METHOD FOR INSULATED-GATE FIELD-EFFECT SEMICONDUCTOR DEVICE
Document Type and Number:
Japanese Patent JP3383262
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To make a switching characteristic good by a method wherein the channel formation region of a patterned non-single-crystal semiconductor film contains oxygen and hydrogen at a specific value or lower, an electric field between a gate electrode and a drain region is set to a specific value or lower, and an insulated gate field-effect semiconductor device is driven in a state that no hysteresis is generated in a drain current/gate voltage characteristic.
SOLUTION: A non-single-crystal semiconductor film 2 which contains an amorphous structure is formed on the surface of a substrate 1. A gate insulating film 3 is laminated on it. After that, a part excluding a region 5 in which a field-effect semiconductor device is formed is removed by a plasma etching method. A pair of impurity regions 7, 8 are formed. The pair of impurity regions 7, 8, the non-single-crystal semiconductor film 2 and junction interfaces 17, 17' constitute a channel formation region. The region contains oxygen at 5×1018 cm-3 or lower and hydrogen. An electric field between a gate electrode and a drain region is set at a range of 3×166 V/cm or lower, and no hysteresis is generated in a drain current/gate voltage characteristic.
Inventors:
Shunpei Yamazaki
Application Number:
JP2000121972A
Publication Date:
March 04, 2003
Filing Date:
May 18, 1984
Export Citation:
Assignee:
Semiconductor Energy Laboratory Co., Ltd.
International Classes:
H01L29/786; H01L21/20; H01L21/336; H01L27/12; (IPC1-7): H01L21/336; H01L21/20; H01L29/786
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