Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
DROP TEST DEVICE
Document Type and Number:
Japanese Patent JP2006030053
Kind Code:
A
Abstract:

To provide a drop test device that is connected to a sensor, reduces an influence by a conductive wire introduced to the outside of a tested object, and can make the tested object collide with a collision surface with a fixed attitude.

The drop test device comprises a tested object holding section 5 for holding a portable terminal 1 mounted with the sensor 7 for detecting an impact at least before a drop, a conductive wire regulating section 3 that is connected to the sensor 7 and regulates in the drop direction, the attitude of a part corresponding to at least the drop distance of the portable terminal 1 of the conductive wire 2 that is introduced to the outside of the portable terminal 1 and used for taking out a signal from the sensor 7, and a collision surface 4a, against which the portable terminal 1 collides after the drop. The conductive wire regulating section 3 drops substantially integrally with the portable terminal 1, and the collision surface 4a has a hole 4 for passing the conductive wire regulating section 3 and the conductive wire 2 at the drop test.


Inventors:
Takeshita, Takao
Akiyama, Yasuhiko
Application Number:
JP2004000211353
Publication Date:
February 02, 2006
Filing Date:
July 20, 2004
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
MATSUSHITA ELECTRIC IND CO LTD
International Classes:
G01N3/303; G01M7/08